378 / 2018-03-31 01:01:12
An Ultra-Fast Short Circuit Protection Solution for E-mode GaN HEMTs
E-mode GaN HEMT,short circuit capability,short circuit protection,reliability
Draft Pending
He Li / The Ohio State University
Xintong Lyu / The Ohio State University
Ke Wang / The Ohio State University
Yousef Abdullah / The Ohio State University
Boxue Hu / The Ohio State University
Zhi Yang / The Ohio State University
Jin Wang / The Ohio State University
Liming Liu / ABB Corporate Research
Sandeep Bala / ABB Corporate Research
The Enhancement-mode (E-mode) Gallium Nitride High-Electron Mobility Transistor (GaN HEMT) has proven excellent electrical performance in various applications. Meantime, multiple comprehensive studies on the short circuit behavior show that GaN HEMTs has much shorter short circuit withstand time compared to conventional silicon (Si) devices. In this paper, the GaN HEMT short circuit capability is first introduced. Based on the testing results, the voltage dip on the phase-leg dc voltage under short circuit condition is proposed to be the short circuit detection signal, and the corresponding detection circuit and ultra-fast short circuit protection method is depicted. Finally, experimental results prove that with the proposed protection method, soft turn-off can be initiated within 200 ns with 400 V dc bus.
Important Date
  • Conference Date

    May 17

    2018

    to

    May 19

    2018

  • Dec 08 2017

    Abstract Submission Deadline

  • Jan 30 2018

    Abstract Notification of Acceptance

  • Feb 10 2018

    Draft paper submission deadline

  • Feb 10 2018

    Final Paper Deadline

  • May 19 2018

    Registration deadline

Sponsored By
IEEE
Organized By
Xi'an Jiaotong University
Xidian University
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