The 15th IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC)

345 / 2019-02-18 11:55:25

The influence of comparator offset on event-driven level-crossing analog-to-digital converter

level-crossing ADC,fixed window scheme,comparator offset,spurious sampling

Plenary track > Analog Circuits

An event-driven fixed window level-crossing analog-to-digital converter (LC-ADC) is presented in this paper. The influence of comparator offset is discussed in detail, and optimization is made in order to avoid spurious sampling. Folding circuit is used in this LC-ADC for signal processing within a fixed window, which achieves small area and wide bandwidth. Designed in 0.18 µm CMOS, the LC-ADC occupies an active area of 0.011 mm2. It can reach 12-bit hardware precision with an input frequency range from 100 Hz to 10 kHz.