417 / 2019-02-26 10:38:29
Polarization measurement method of semiconductor laser
collimation,polarized beam splitter,wave plate,semiconductor laser
Final Paper
Qingmin Li / Xi'an Lumcore Optoelectronics Technologies Co., Ltd
Kechang Song / Xi'an Lumcore Optoelectronics Technologies Co., Ltd
Huanhuan Zhang / Xi'an Lumcore Optoelectronics Technologies Co., Ltd
Zhanqiang Ren / Xi'an Lumcore Optoelectronics Technologies Co., Ltd
Cheng Sun / Xi'an Lumcore Optoelectronics Technologies Co., Ltd
Yongchao Zhao / Xi'an Lumcore Optoelectronics Technologies Co., Ltd
In this paper, the polarization degree of semiconductor laser device in COS package form is measured according to the principle of collimation lens, the light characteristics of polarized beam splitter and the characteristics of wave plate can change the polarization state of laser beam, and the device and measurement method of measuring system for polarization degree of 808nm semiconductor laser device are described, and the purpose of the polarization test and the factors affecting the polarization degree.
Important Date
  • Conference Date

    Jun 12

    2019

    to

    Jun 14

    2019

  • Jun 12 2019

    Draft paper submission deadline

  • Jun 14 2019

    Registration deadline

Organized By
Xi'an University of Technology
Contact Information