564 / 2019-03-14 23:23:23
Effects of Annealing Temperature on the Properties of ZnO Thin Films and Ultraviolet Photodetectors
ZnO thin film,,MSM,,Ultraviolet detector,,Annealing temperatures
Final Paper
Wenxia Wang / Xi’an University of Technology
Yantao Liu / Xi'an University of Technology
Jianping Ma / Xi’an University of Technology
Ying Wang / Xi’an University of Technology
Xin Peng / Xi’an University of Technology
Jiqiang He / Xi’an University of Technology
ZnO thin films were deposited by RF magnetron sputtering on glass substrates, and the Au-ZnO-Au ultraviolet photodetectors were fabricated. The effects of annealing temperature on the properties of ZnO thin films and ultraviolet photodetectors were investigated, systematically. The results show that ZnO film has a c-axis preferred orientation, the resistivity and carrier concentration of thin film can be effecttively improved from changing annealing temeprarue. The average transmittance of ZnO is above 85 % in the visible range and the strong absorption of ultraviolet light can be observed. After annealing at 500 oC, the dark current and photocurrent of photodetectors can reach 1.5 µA and 3.6 mA at 10 V bias respectively.
Important Date
  • Conference Date

    Jun 12

    2019

    to

    Jun 14

    2019

  • Jun 12 2019

    Draft paper submission deadline

  • Jun 14 2019

    Registration deadline

Organized By
Xi'an University of Technology
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