419 / 2019-02-28 22:45:02
Study on reflection zone plate diffraction property and its application for ICF
reflection zone plate; hohlraum; soft X-ray; raytracing; X-LAB
Abstract Accepted
Zuhua Yang / LFRC,CAEP
The elliptical reflection zone plate is a kind of optical element for x-ray application and has focusing, dispersion properties. This optic has the advantages of focusing limitation size and fabrication difficulty used for hard X-ray, compared with the transmission zone plate (FZP). It is fabricated on a bulk substrate and does not have much difficulty in the fabrication process. We developed scalar diffraction and raytracing methods to simulate the designed reflection zone plate diffraction properties. The simulation results verified and demonstrated the focusing and dispersion properties of reflection zone plate for the well aligned mount. In addition, a pulse soft X-ray calibration system for hohlraum spectrum analysis is designed and analyzed using the raytracing tool, X-LAB. The elliptical reflection zone plate also has potential applications in investigating x-ray fluorescence spectra and other fields.
Important Date
  • Conference Date

    May 29

    2019

    to

    Jun 02

    2019

  • Mar 20 2019

    Abstract Submission Deadline

  • Mar 20 2019

    Draft paper submission deadline

  • Apr 10 2019

    Abstract Notification of Acceptance

  • Jun 02 2019

    Registration deadline

Organized By
Institute of Applied Physics and Computational Mathematics
Laser Fusion Research Center, China Academy of Engineering Physics
Xi'an Jiaotong University
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