537 / 2019-03-20 10:24:05
Boron–oxygen complex yields n-type surface layer in semiconducting diamond
Diamond, boron, defects, semiconductor, high pressure
Abstract Accepted
Xiaobing Liu / Qufu Normal University
Diamond is a wide-bandgap semiconductor possessing exceptional
physical and chemical properties with the potential to miniaturize
high-power electronics. Whereas boron-doped diamond (BDD) is a
well-known p-type semiconductor, fabrication of practical diamond-based
electronic devices awaits development of an effective n-type
dopant with satisfactory electrical properties. Here we report the
synthesis of n-type diamond, containing boron (B) and oxygen (O)
complex defects. We obtain high carrier concentration (∼0.778 ×
10^21 cm^−3) several orders of magnitude greater than previously
obtained with sulfur or phosphorous, accompanied by high electrical
conductivity. In high-pressure high-temperature (HPHT) boron-doped
diamond single crystal we formed a boron-rich layer ∼1–
1.5 μm thick in the {111} surface containing up to 1.4 atomic % B.
We show that under certain HPHT conditions the boron dopants
combine with oxygen defects to form B–O complexes that can be
tuned by controlling the experimental parameters for diamond
crystallization, thus giving rise to n-type conduction. First-principles
calculations indicate that B3Oand B4O complexes with low formation
energies exhibit shallow donor levels, elucidating the mechanism of
the n-type semiconducting behavior.
Important Date
  • Conference Date

    May 29

    2019

    to

    Jun 02

    2019

  • Mar 20 2019

    Abstract Submission Deadline

  • Mar 20 2019

    Draft paper submission deadline

  • Apr 10 2019

    Abstract Notification of Acceptance

  • Jun 02 2019

    Registration deadline

Organized By
Institute of Applied Physics and Computational Mathematics
Laser Fusion Research Center, China Academy of Engineering Physics
Xi'an Jiaotong University
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