86 / 2020-04-18 22:10:32
Review on the Application of the High-k Dielectrics in Lateral Double-Diffused Metal Oxide Semiconductor
High-k dielectrics,LDMOS,breakdown voltage;,specific on-resistance,figure of merit
Final Paper
Yufeng Guo / Nanjing University of Posts and Telecommunications
Zhenyu Zhang / Nanjing University of Posts and Telecommunications
Jiafei Yao / Nanjing Univesity of Posts and Telecommunications
Ling Du / Nanjing University of Posts and Telecommunications
Man Li / Nanjing University of Posts and Telecommunications
Jun Zhang / Nanjing University of Posts and Telecommunications
Kemeng Yang / Nanjing University of Posts and Telecommunications
Maoling Zhang / Nanjing University of Posts and Telecommunications
Lateral Double-Diffused Metal Oxide Semiconductor (LDMOS) is widely used in power integrated circuits due to its advantages of high breakdown voltage, high current, and easy integration. The relationship between the breakdown voltage (BV) and the specific on-resistance (Ron,sp) is the main contradiction of the LDMOS. Researches show that the high-k dielectrics can effectively alleviate this contradiction. In this paper, the application of high-k dielectrics in LDMOS is classified and discussed. The different LDMOS structures are compared in terms of BV, Ron,sp and figure of merit (FOM). Meanwhile, the fabrication processes of different high-k dielectric technologies are analyzed and compared. Furthermore, the advantages and disadvantages of the high-k dielectrics are concluded for its application in LDMOS.
Important Date
  • Conference Date

    Jul 10

    2021

    to

    Jul 12

    2021

  • May 10 2021

    Draft paper submission deadline

  • Jul 06 2021

    Registration deadline

Sponsored By
Changsha University of Science & Technology
Supported By
IEEE Electron Devices Society
IEEE
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