35 / 2020-09-24 18:10:03
Microwave Reflectometer for Density Measurement on J-TEXT Tokamak
microwave reflectometer,dynamic calibration,density profile
Final Paper
Xiehang Ren / Huazhong University of Science and Technology
Zhoujun Yang / Huazhong University of Science and Technology
Microwave reflectometer is an essential diagnostic tool with high spatial and temporal resolution for the measurement of plasma density profile. In recent years, a microwave reflectometry system has been developed and optimized on the J-TEXT tokamak. It consists of three parts: Q band (33-50GHz) with extra-ordinary mode (X-mode), V band (50-75GHz) with X mode and Q band with ordinary mode (O-mode). Its measurement range covers from the edge to core of the low field side plasma. To obtain a linear frequency sweep, the dynamic calibration of the voltage control oscillator (VCO) is completed. The profile measured by the reflectometer is in good agreement with the result of the polarimetry.
Important Date
  • Conference Date

    Nov 02

    2020

    to

    Nov 04

    2020

  • Oct 27 2020

    Draft paper submission deadline

  • Nov 03 2020

    Contribution Submission Deadline

  • Nov 04 2020

    Registration deadline

  • Nov 17 2020

    Final Paper Deadline

Sponsored By
IEEE IAS Student Chapter of Huazhong University of Science and Technology (HUST)
Organized By
Huazhong University of Science and Technology
Contact Information