Presentation Details
  1. Home
  2. Presentation List
  3. Presentation Details
Microwave Reflectometer for Density Measurement on J-TEXT Tokamak
ID：130 View Protection：ATTENDEE Updated Time：2020-10-15 19:15:56 Hits：818 Oral Presentation

Start Time：2020-11-04 11:00（Asia/Shanghai）

Duration：15min

Session：F High Magnetic Field Engineering and Fusion Technology » F1Session 29

Video No Permission Presentation File

Tips: Only the registered participant can access the file. Please sign in first.

Abstract
Microwave reflectometer is an essential diagnostic tool with high spatial and temporal resolution for the measurement of plasma density profile. In recent years, a microwave reflectometry system has been developed and optimized on the J-TEXT tokamak. It consists of three parts: Q band (33-50GHz) with extra-ordinary mode (X-mode), V band (50-75GHz) with X mode and Q band with ordinary mode (O-mode). Its measurement range covers from the edge to core of the low field side plasma. To obtain a linear frequency sweep, the dynamic calibration of the voltage control oscillator (VCO) is completed. The profile measured by the reflectometer is in good agreement with the result of the polarimetry.
Keywords
microwave reflectometer,dynamic calibration,density profile
Speaker
Xiehang Ren
Huazhong University of Science and Technology

Submission Author
Xiehang Ren Huazhong University of Science and Technology
Zhoujun Yang Huazhong University of Science and Technology
Submit Comment
Verify Code Change Another
All Comments
Important Date

  • Conference Date

    Nov 02

    2020

    to

    Nov 04

    2020

  • Oct 27 2020

    Draft paper submission deadline

  • Nov 03 2020

    Contribution Submission Deadline

  • Nov 04 2020

    Registration deadline

  • Nov 17 2020

    Final Paper Deadline

Sponsored By
IEEE IAS Student Chapter of Huazhong University of Science and Technology (HUST)
Organized By
Huazhong University of Science and Technology
Contact Information
Login to view full contact details
Previous Conferences