Datasheet Driven Turn Off Overvoltage Prediction for Silicon Carbide Power MOSFETs Based on Theoretical Analysis
ID:1 View Protection:ATTENDEE Updated Time:2021-07-21 19:49:39 Hits:1831 Oral Presentation

Start Time:2021-08-27 08:30(Asia/Shanghai)

Duration:15min

Session:Room1 Oral Session 1 » S1&S2WBG Device Modeling, Simulation and Reliability

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Abstract
This paper presents a turn-off overvoltage prediction method for SiC MOSFET based on device datasheet parameters. First, the turn-off process of a SiC MOSFET is analyzed, and the key parameters associated with turn-off overvoltage are identified. Second, a quadratic equation containing loop parasitic inductance, load current, gate resistance and other parameters from datasheet is derived under several reasonable  assumptions. Third, simulation results and experimental results are presented to validate the proposed method. It is found that the prediction value is always larger and the accuracy can reach 15%. Finally, the error between the prediction method and experimental results is analysed, which proves that the prediction is always conservative.
Keywords
wide bandgap devices,turn off,overvoltage
Speaker
Cheng Qian
Huazhong University of Science and Technology

Submission Author
Cheng Qian Huazhong University of Science and Technology
智强 王 华中科技大学
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Important Date
  • Conference Date

    Aug 25

    2021

    to

    Aug 27

    2021

  • Apr 21 2021

    Abstract Submission Deadline

  • May 15 2021

    Abstract Notification of Acceptance

  • Jun 25 2021

    Final Paper Deadline

  • Aug 24 2021

    Contribution Submission Deadline

  • Aug 27 2021

    Registration deadline

Sponsored By
IEEE
IEEE ELECTRONIC DEVICE SOCIETY
Organized By
Huazhong University of Science and Technology