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Test Beyond JEDEC – SiC MOSFET Reliability Supplemental Tests
ID：134 View Protection：ATTENDEE Updated Time：2021-08-05 10:23:27 Hits：1192 Oral Presentation

Start Time：Pending（Asia/Shanghai）

Duration：Pending

Session：No Session »

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Abstract
Test Beyond JEDEC – SiC MOSFET Reliability Supplemental Tests
Keywords
Speaker
Ye Zhong
CTO InventChip Technology Co., Ltd.

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Important Date

  • Conference Date

    Aug 25

    2021

    to

    Aug 27

    2021

  • Apr 21 2021

    Abstract Submission Deadline

  • May 15 2021

    Abstract Notification of Acceptance

  • Jun 25 2021

    Final Paper Deadline

  • Aug 24 2021

    Contribution Submission Deadline

  • Aug 27 2021

    Registration deadline

Sponsored By
IEEE
IEEE ELECTRONIC DEVICE SOCIETY
Organized By
Huazhong University of Science and Technology
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