The influence of hydrogen annealing on minority carrier lifetimes in 4H-SiC
ID:35 View Protection:PUBLIC Updated Time:2021-08-18 17:29:15 Hits:1364 Poster Presentation

Start Time:2021-08-27 12:32(Asia/Shanghai)

Duration:1min

Session:P Poster » P1Poster 1

Abstract
Silicon carbide (SiC) has received increasing attention as a significant semiconductor material for ultrahigh-voltage and low-loss power devices owing to its superior physical properties.The bipolar devices require a long carrier lifetime to achieve sufficient conductivity modulation in the forward conduction mode. In this study, treatments of 1300 ℃ thermal oxidation and hydrogen annealing were applied on 4H-SiC epitaxial wafer to modulate the minority carrier lifetime, which was investigated by microwave photoconductive decay (μ-PCD).
Keywords
4H-SiC,,minority carrier lifetimes,power devices
Speaker
Ruijun Zhang
XiaMen University;Department of Physics

Submission Author
Ruijun Zhang XiaMen University;Department of Physics
Rongdun Hong XiaMen University;Department of Physics
Jiafa Cai XiaMen University;Department of Physics
Xiaping Chen XiaMen University;Department of Physics
Dingqu Lin XiaMen University;Department of Physics
Shaoxiong Wu XiaMen University;Department of Physics
Mingkun Zhang XiaMen University;Department of Physics
Yuning Zhang XiaMen University;Department of Physics
Jingrui Han Dongguan Tianyu Semiconductor Technology Co., Ltd
Zhengyun Wu XiaMen University;Department of Physics
Feng Zhang Department of Physics; Xiamen University
Submit Comment
Verify Code Change Another
All Comments
Important Date
  • Conference Date

    Aug 25

    2021

    to

    Aug 27

    2021

  • Apr 21 2021

    Abstract Submission Deadline

  • May 15 2021

    Abstract Notification of Acceptance

  • Jun 25 2021

    Final Paper Deadline

  • Aug 24 2021

    Contribution Submission Deadline

  • Aug 27 2021

    Registration deadline

Sponsored By
IEEE
IEEE ELECTRONIC DEVICE SOCIETY
Organized By
Huazhong University of Science and Technology