A Survey on Modeling of SiC IGBT
ID:41 View Protection:PUBLIC Updated Time:2021-07-21 20:02:16 Hits:1433 Poster Presentation

Start Time:2021-08-27 12:27(Asia/Shanghai)

Duration:1min

Session:P Poster » P1Poster 1

Abstract
Nowadays, SiC-based semiconductor has become a research hotpot due to its superior material characteristics, such as wide bandgap and high thermal conductivity. Especially, SiC IGBT is considered to be the most promising device in ultrahigh-voltage electrical power switches in the future, due to its excellent flow capacity and low on-state resistance. Several SiC models have been proposed to study the behavior of the devices in the past 10 years, which used different methods and focused on different aspects. Researchers have dedicated efforts to find models which can accurately characterise the electrical and terminal behaviors of SiC IGBT, in order to push the path forward for circuit design and packaging structure optimization. In this paper, the existing models of SiC IGBTs are concluded chronologically by its core method of modeling, foremost contribution, limitation and application value. In the end, some trends for future research are put forward.
 
Keywords
SiC IGBT,modeling
Speaker
Yuwei Wu
Xi’an Jiaotong University

Submission Author
Yuwei Wu Xi’an Jiaotong University
Laili Wang Xi'an Jiaotong University
Jianpeng Wang Xi’an Jiaotong University
Feng Zhang Department of Physics; Xiamen University
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Important Date
  • Conference Date

    Aug 25

    2021

    to

    Aug 27

    2021

  • Apr 21 2021

    Abstract Submission Deadline

  • May 15 2021

    Abstract Notification of Acceptance

  • Jun 25 2021

    Final Paper Deadline

  • Aug 24 2021

    Contribution Submission Deadline

  • Aug 27 2021

    Registration deadline

Sponsored By
IEEE
IEEE ELECTRONIC DEVICE SOCIETY
Organized By
Huazhong University of Science and Technology