Modeling and Analysis of the Switching Characteristics Difference for Paralleling SiC MOSFETs in Multichip Power Modules
ID:45 View Protection:PUBLIC Updated Time:2021-08-20 20:39:34 Hits:1411 Poster Presentation

Start Time:2021-08-27 12:23(Asia/Shanghai)

Duration:1min

Session:P Poster » P1Poster 1

Abstract
Modeling and analysis of the 1200V/600A silicon carbide (SiC) MOSFET power module with multichip in parallel is investigated. And the different switching characteristics of parallel chips are analyzed. The equivalent circuits of both the current commutation power loop and the gate loop are derived. The parasitic parameters are extracted by ANSYS Q3D. The parasitic inductance in the power loop is studied considering the mutual influence. The unbalanced layout of the gate loop would cause different switching characteristics of the chips in parallel. A mathematical model is built to analyze the relationship between gate resistor and stray inductance. The unbalanced current sharing during the transient could be eased by changing the gate resistor of each chip. The switching characteristics of the SiC MOSFET power module are measured in the double pulse tester under 400V/375A condition. The results validate the analysis of parasitic parameters.
Keywords
SiC MOSFETs Modules,parallel laying,electromagnetic modeling,switching characteristics difference,ANSYS Q3D,parasitic inductance
Speaker
Wenyu Li
Fudan University; China; Shanghai; 200433

Submission Author
Wenyu Li Fudan University; China; Shanghai; 200433
Saijun Mao Fudan University;Shanghai;China
Zhikun Wang Fudan University
Shuhao Yang Fudan University
Yujie Ding Fudan University; China; Shanghai
Keqiu Zeng Ltd.;Philips Healthcare (Suzhou) Co.
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Important Date
  • Conference Date

    Aug 25

    2021

    to

    Aug 27

    2021

  • Apr 21 2021

    Abstract Submission Deadline

  • May 15 2021

    Abstract Notification of Acceptance

  • Jun 25 2021

    Final Paper Deadline

  • Aug 24 2021

    Contribution Submission Deadline

  • Aug 27 2021

    Registration deadline

Sponsored By
IEEE
IEEE ELECTRONIC DEVICE SOCIETY
Organized By
Huazhong University of Science and Technology