An Optimized Parameter Design Method for Desaturation Protection Circuit towards Fast Response Speed and Strong Noise Immunity
ID:70 View Protection:ATTENDEE Updated Time:2021-07-21 20:04:10 Hits:1516 Oral Presentation

Start Time:2021-08-27 10:30(Asia/Shanghai)

Duration:15min

Session:Room2 Oral Session 2 » S5&S6WBG Device Design and Gate Drivers

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Abstract
This paper presents a theoretical analysis and an optimized parameter design method of desaturation short-circuit protection for fast response speed and strong noise immunity. First, the mechanism of false triggering of desaturation protection are analyzed in detail, and based on the analysis several key related factors are identified. Second, a noise suppression ability evaluation method and a corresponding optimized parameter design method based on aforementioned analysis are proposed, which is capable of enhancing noise immunity without sacrificing response speed. Third, two typical desaturation protection circuits are compared with the proposed evaluation method and optimized parameter design examples are presented. Finally, simulation and experimental results are presented to validiate the proposed parameter optimization method.
Keywords
Desaturation,Short Circuit Protection,wide bandgap devices
Speaker
Cheng Qian
Huazhong University of Science and Technology

Submission Author
Cheng Qian Huazhong University of Science and Technology
智强 王 华中科技大学
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Important Date
  • Conference Date

    Aug 25

    2021

    to

    Aug 27

    2021

  • Apr 21 2021

    Abstract Submission Deadline

  • May 15 2021

    Abstract Notification of Acceptance

  • Jun 25 2021

    Final Paper Deadline

  • Aug 24 2021

    Contribution Submission Deadline

  • Aug 27 2021

    Registration deadline

Sponsored By
IEEE
IEEE ELECTRONIC DEVICE SOCIETY
Organized By
Huazhong University of Science and Technology