IEEE Workshop on Wide Bandgap Power Devices and Applications in Asia (WIPDA-ASIA 2021)

In this paper, a state-of-the-art, intelligent power cycling platform is introduced in detail. The test platform allows to perform both DC- and AC- power-cycling tests on power electronic discrete components as well as modules up to 70 A_rms / 700 V_DC.  Vital parameters of the device under test (DUT) as junction temperature and on-state voltage are measured during the test. A 19” ‑ standard industrial rack is used, which enables a flexible and compact test platform design. A detailed description of the PCB structure and safety precautions is also provided.

accelerated power cycling test, reliability, lifetime estimation, on-line monitoring, wear-out, test apparatus