Adaptive Digital Technique Assisted Hard Switching Fault Detection for SiC MOSFETs
ID:88 View Protection:ATTENDEE Updated Time:2021-08-14 09:41:54 Hits:1696 Oral Presentation

Start Time:2021-08-27 15:00(Asia/Shanghai)

Duration:15min

Session:Room1 Oral Session 1 » S3&S4WBG Device Applications, Package Design & Analysis

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Abstract
This paper presents a Hard Switching Fault (HSF) detection technique for SiC MOSFETs. The reliability of SiC MOSFETs under short circuit conditions is a crucial concern and can lead to failure. The proposed method uses only the device voltage sensing to detect the HSF condition. Instead of fixed blanking time present in the desaturation method, the proposed method adaptively changes the blanking time during every switching cycle. By this, faster detection of the shoot-through event can be achieved and it can reduce the magnitude of the fault peak current. The experimental verification of the proposed method was carried with a discrete 1kV, 32A SiC MOSFET. The results show satisfactory operation of the proposed method,where the HSF event is detected within few tens of nanoseconds.
 
Keywords
Short-circuit test;HSF;Hard Swiching Fault;SiC MOSFET;Adaptive Time
Speaker
Saravanan Dhanasekaran
Research Scholar Indian Institute of Technology Madras

I received the B.E degree in Electrical and Electronics Engineering from Sri Sivasubramaniya Nadar College of Engineering, Chennai, India in 2017. I am currently working toward the M.S degree in power electronics with the ElectricalDepartment, Indian Institute of Technology, Madras, India. My research interest includes the  Active Gate Drivers for wide bandgap devices in high-power converters. 

Submission Author
Saravanan Dhanasekaran IIT Madras
Vamshi Krishna Miryala Indian Institute of Technology Madras
Kamalesh Hatua Indian Institute of Technology Madras
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Important Date
  • Conference Date

    Aug 25

    2021

    to

    Aug 27

    2021

  • Apr 21 2021

    Abstract Submission Deadline

  • May 15 2021

    Abstract Notification of Acceptance

  • Jun 25 2021

    Final Paper Deadline

  • Aug 24 2021

    Contribution Submission Deadline

  • Aug 27 2021

    Registration deadline

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IEEE
IEEE ELECTRONIC DEVICE SOCIETY
Organized By
Huazhong University of Science and Technology