194 / 2021-10-31 17:18:38
A New Simple and Low Cost Short Circuit Protection Method for p-GaN HEMT
Enhancement mode, GaN HEMT, gate voltage, short circuit protection, short circuit capability.
Final Paper
Xiaohua Zhan / School of Electrical Engineering, Chongqing University
Pengju Sun / School of Electrical Engineering, Chongqing University
Xu Huang / School of Electrical Engineering, Chongqing University
Yan Wang / School of Electrical Engineering, Chongqing University
The short circuit capability of gallium nitride high electron mobility transistor (GaN HEMT) exhibits great differences under different drain-source voltages, thus its short circuit protection is critical for practical applications. This paper presents a new short circuit protection method developed for p-GaN HEMTs, which is based on the detection of gate voltage during on-state of the devices. The short circuit capability and the unique gate characteristics for p-GaN during short circuit fault are illustrated, and the principle of the proposed short circuit protection method is analyzed in detail. The experimental results show that the proposed method can detect the short circuit within 620ns and turn off the GaN devices within 140ns. Compared with conventional desaturation protection, the scheme in this paper offers benefits in terms of low costs, temperature advantage, flexibility in threshold selection and minimal impact on the normal switching behavior.
Important Date
  • Conference Date

    Jul 11

    2023

    to

    Aug 18

    2023

  • Nov 10 2021

    Draft paper submission deadline

  • Dec 10 2021

    Registration deadline

  • Dec 11 2021

    Contribution Submission Deadline

Sponsored By
IEEE IAS
Organized By
IEEE IAS Student Chapter of Southwest Jiaotong University (SWJTU)
IEEE IAS Student Chapter of Huazhong University of Science and Technology (HUST)
IEEE PELS (Power Electronics Society) Student Chapter of HUST