260 / 2021-11-07 21:05:06
A Probabilistic Model of Lightning Trip-out Rate Calculation for Overhead Contact Lines
Overhead contact lines,lightning strike,probabilistic failure model,stochastic process,Monte Carlo simulation
Final Paper
Ke Chen / School of Electrical Engineering, Southwest Jiaotong University, Chengdu 610031, China;China Railway ErYuan Engineering Group CO. LTD, Chengdu 610031, China
Jian Wang / School of Electrical Engineering, Southwest Jiaotong University, Chengdu 610031, China
Chenlin Xie / School of Electrical Engineering, Southwest Jiaotong University, Chengdu 610031, China
Long Yu / School of Electrical Engineering, Southwest Jiaotong University, Chengdu 610031, China
Due to the complex and changeful outdoor operating environments of the overhead contact lines (OCLs), lightning strike has become an extremely significant cause of affecting the reliability and maintenance performance of OCLs, which is characterized by stochasticity and seasonality. Hence, to investigate the impacts of the lighting occurrence and intensity on the OCLs, this paper develops a time-dependent probabilistic model for calculating lighting trip-out rate and evaluating the lightning failure performance. In addition, the arrival time and number of the lighting strikes are modelled by non-homogeneous Poisson process (NHPP), and the probability distributions of lightning intensity (lightning peak current and ground flash density) are parametrized by the actual lightning strike data. Furthermore, a Monte Carlo simulation is utilized to analyze the trip-out probability of OCLs subject to induced lightning and direct lightning. The obtained results can be recognized as important guidance for lightning protection and improving reliability performance of OCLs.
Important Date
  • Conference Date

    Jul 11

    2023

    to

    Aug 18

    2023

  • Nov 10 2021

    Draft paper submission deadline

  • Dec 10 2021

    Registration deadline

  • Dec 11 2021

    Contribution Submission Deadline

Sponsored By
IEEE IAS
Organized By
IEEE IAS Student Chapter of Southwest Jiaotong University (SWJTU)
IEEE IAS Student Chapter of Huazhong University of Science and Technology (HUST)
IEEE PELS (Power Electronics Society) Student Chapter of HUST