359 / 2021-11-10 15:30:31
High Impedance Fault Diagnosis Method Based on Conditional Wasserstein Generative Adversarial Network
high impedance fault, fault diagnosis, small imbalanced sample, generative adversarial network, data augmentation
Final Paper
Liu Wen-li / Fuzhou University
Guo Mou-fa / Fuzhou University
Gao Jian-Hong / Fuzhou University
Data-driven fault diagnosis of high impedance fault (HIF) has received increasing attention and achieved fruitful results. However, HIF data is difficult to obtain in engineering. Furthermore, there exists an imbalance between the fault data and non-fault data, making data-driven methods hard to detect HIFs reliably under the small imbalanced sample condition. To solve this problem, this paper proposes a novel HIF diagnosis method based on conditional Wasserstein generative adversarial network (WCGAN). By adversarial training, WCGAN can generate sufficient labeled zero-sequence current signals, which can expand the limited training set and achieve the balanced distribution of the samples. In addition, the Wasserstein distance was introduced to improve the loss function. Experimental results indicate that the proposed method can generate high-quality samples and achieve a high accuracy rate of fault detection in the case of small imbalanced samples.
Important Date
  • Conference Date

    Jul 11

    2023

    to

    Aug 18

    2023

  • Nov 10 2021

    Draft paper submission deadline

  • Dec 10 2021

    Registration deadline

  • Dec 11 2021

    Contribution Submission Deadline

Sponsored By
IEEE IAS
Organized By
IEEE IAS Student Chapter of Southwest Jiaotong University (SWJTU)
IEEE IAS Student Chapter of Huazhong University of Science and Technology (HUST)
IEEE PELS (Power Electronics Society) Student Chapter of HUST