Dielectric properties of silicon dioxide filled polydimethylsiloxane: Relationship with crystal structures
ID:34 View Protection:ATTENDEE Updated Time:2022-08-29 10:53:57 Hits:271 Oral Presentation

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Abstract
As skirt and shed materials of outdoor insulators, silicon dioxide (SiO2) filled polydimethylsiloxane (PDMS) sometimes have to work under extremely cold environment, which can induce crystallization inside the PDMS composites. Herein, differential scanning calorimeter (DSC) is combined with X-ray diffractometer (XRD) to investigate the crystal structures of PDMS composites after non-isothermal crystallization and isothermal crystallization at -60°C. The dielectric properties of SiO2 filled PDMS are further measured. DSC and XRD results indicate that the crystals size is larger and crystal spacing is denser for non-isothermal crystallization than those for isothermal crystallization, which may be due to the few small crystal nucleus and enhanced mobility of chains at relatively high isothermal crystallization temperature. Compared to isothermal crystallization, the dielectric relaxations magnitude of rigid amorphous fraction caused by molecules chains restrained in crystals is less and relaxations corresponding to mobile amorphous fraction is more concentrated, which is due to the more stable crystal structures after non-isothermal crystallization.
Keywords
Crystal structures,isothermal crystallization,non-isothermal crystallization,polydimethylsiloxane,Dielectric properties
Speaker
Ying Lin
Hefei University of Technology

Submission Author
Ying Lin Hefei University of Technology
Zheng Yang Hefei University of Technology
Yulong Shi HeFei University of Technology
Yuhao Liu Tsinghua University
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    Sep 25

    2022

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    Sep 29

    2022

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