216 / 2023-04-15 20:54:25
Development of X-ray fluorescence holography under high pressure
x-ray fluorescence holography,high pressure,SrTiO3
Abstract Accepted
Xinhui Zhan / Hiroshima Univercity
Naoki Ishimatsu / Hiroshima University
Koji Kimura / Nagoya Institute of Technology
Tomoko Sato / Hiroshima University
Naohisa Happo / Hiroshima City University
Naomi Kawamura / SPring-8
Kotaro Higashi / SPring-8
Ritsuko Eguchi / Okayama University
Yoshihiro Kubozono / Okayama University
Hiroo Tajiri / SPring-8
Toru Shinmei / Ehime University
Tetsuo Irifune / Ehime University
Shinya Hosokawa / Kumamoto University
Halubai Sekhar / Nagoya Institute of Technology
Tomohiro Matsushita / Nara Institute of Science and Technology
Koichi Hayashi / Nagoya Institute of Technology
X-ray fluorescence holography (XFH) is an atomic structure determination technique that utilizes fluorescing atoms as a wave source or a monitor of the interference field within a crystal sample. [1] Because it provides three-dimensional atomic images around a specified element within a range of up to a few nm in real space, XFH is used for medium-range local structural analysis. However, XFH has not been measured under high pressure yet. In this work, we combined the XFH with the diamond anvil cell (DAC) to study the local structures around Sr atom in a single-crystalline SrTiO3 at high pressure. The experiment of XFH was carried out at BL39XU of SPring-8 using the normal mode setup. A symmetry DAC with a wide window has been newly designed, and the window allowed us to collect the XFH patterns from the sample irradiated through a beryllium gasket. The most serious difficulty to be solved under high pressure is the scattered X-rays from the diamond anvils and gasket, which are superimposed on the XFH image from the sample. We have demonstrated that nano polycrystalline diamond is a good material for the anvil that does not generate the background scattering.[2] As a result, Kossel lines of SrTiO3 were successfully observed. Furthermore, the position of the Kossel line gradually moved as a pressure dependence of the XFH image. Bragg scattering from the beryllium gasket remained as background signal of our XFH images, however, methods to remove the Bragg scattering are discussed in the poster presentation.

 
Important Date
  • Conference Date

    Jun 05

    2023

    to

    Jun 09

    2023

  • Apr 30 2023

    Early Bird Registration

  • May 01 2023

    Abstract Submission Deadline

  • May 01 2023

    Abstract Notification of Acceptance

  • May 01 2023

    Draft paper submission deadline

  • May 31 2023

    Registration deadline

Sponsored By
Science and Technology on Plasma Physics Laboratory
Department of Astronomy, Beijing Normal University
Organized By
Matter and Radiation at Extremes
Institute of Fluid Physics, China Academy of Engineering Physics, China
Institute of Applied Physics and Computational Mathematics, Beijing, China
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