Abstract List
My Submissions
98
The output characteristic model of SiC DSRD is established by BP neural networkFinal Paper

Ruiheng Tian, Xiao-Yan Tang*, Jingkai Guo, Lejia Sun, ZHANG Yuming

Special Sessions > SS06 - Artificial Intelligence for Semiconductor Modelling and Applications

91
A Data-Driven Approach for Power IGBT Operation State Prediction Based on domain adapted BiLSTM networksFinal Paper

Shuhan Deng, Weihua Li, Ke Yue, Jipu Li, Ruyi Huang, Zhuyun Chen*

Special Sessions > SS06 - Artificial Intelligence for Semiconductor Modelling and Applications

71
A Prior Knowledge-Based Neural Network Model for Degradation Prediction of Microwave HBT S-parametersFinal Paper

Hongliang Lv*, Lin Cheng, Silu Yan, Junjun Qi, Wei Cheng, Yuming Zhang

Special Sessions > SS06 - Artificial Intelligence for Semiconductor Modelling and Applications

58
Research on Emotion Recognition Based on Multi-modal Physiological SignalsFinal Paper

Zhimin Zhang, Lin Xu, Xingyi Chen, Chengyu Liu, Jianqing Li, Yuwen Li*

Special Sessions > SS06 - Artificial Intelligence for Semiconductor Modelling and Applications

38
A Physics-Informed Artificial Neural Network Modeling Approach for Wide Temperature Range 4H-SiC MOSFETsFinal Paper

Wenhao Yang, Yuyin Sun, Mengnan Qi, Shasha Mao, Yimeng Zhang*, Yuming Zhang, Song Bai

Special Sessions > SS06 - Artificial Intelligence for Semiconductor Modelling and Applications

29
Research on sEMG pattern recognition algorithm and implementation of a gesture recognition systemFinal Paper

Zhimin Zhang, Yuwen Li*, Yuepeng Tian

Special Sessions > SS06 - Artificial Intelligence for Semiconductor Modelling and Applications

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Important Date

  • Conference Date

    Nov 02

    2023

    to

    Nov 04

    2023

  • Dec 15 2023

    Draft paper submission deadline

  • Dec 20 2023

    Registration deadline

Sponsored By
IEEE Instrumentation and Measurement Society
Xidian University
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