High repetition frequency XFEL photon energy choice with XFEL-materials damage process simulations
ID:133 View Protection:ATTENDEE Updated Time:2024-04-23 00:27:31 Hits:251 Poster Presentation

Start Time:Pending(Asia/Shanghai)

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Abstract
XFEL leads a temporal and spatial diagnostic capability, with its ultra-high photon flux, ultra-short pulse-width and strong coherence. However, these characteristics can also cause a damage of the diagnostic samples. Especially in high-repetition-rate XFEL experiments, the damage will affect the diagnostic results of next XFEL pulse. Therefore, the balance between damage and signal-to-noise ratio would affect the efficiency of high-repetition-rate XFEL experiments. Here we built a XFEL-materials interactions code called XMI for simulating the damage process and diffraction diagnostic process. Moreover, we found the photon energy of XFEL would be the key parameter.
 
Keywords
High repetition frequency XFEL,XFEL-materials damage
Speaker
YiHan Liang
China; China Academy of Engineering Physics; Institute of Fluid Physics

Submission Author
YiHan Liang China; China Academy of Engineering Physics; Institute of Fluid Physics
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Important Date
  • Conference Date

    May 13

    2024

    to

    May 17

    2024

  • Mar 31 2024

    Registration deadline

  • Apr 15 2024

    Abstract Submission Deadline

Sponsored By
National Key Laboratory of Shock wave and Detonation Physics
School of Physics, Zhejiang University
Pulsed Power Technology and Application Association of Chinese Nuclear Society
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