Label Distribution Guided Domain Adversarial Network for Sample Imbalance Fault Diagnosis of Rotating Machinery
ID:13 View Protection:ATTENDEE Updated Time:2025-11-10 10:40:14 Hits:162 Oral Presentation

Start Time:2025-11-22 14:20(Asia/Shanghai)

Duration:20min

Session:S2 Parallel Session 2 » S2-1Parallel Session 2-22 PM

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Abstract
Traditional intelligent fault diagnosis methods assume sufficient training data sharing the same distribution as test data. However, in actual industrial scenarios, rotating machinery often operates under different working conditions. In addition, data for some special fault types of rotating machinery are extremely scarce, which leads to an imbalance in fault samples. To address the above issues, this paper proposes the Label Distribution Domain Adversarial Network (LDDAN). This network integrates nonlinear dynamic weight adjustment, domain adversarial transfer learning, and semi-supervised strategies. By dynamically adjusting weights to enhance the focus on minority class samples, it mitigates imbalance bias. It also reduces cross-condition distribution differences through domain adversarial learning and improves the utilization of unlabeled data with semi-supervised learning, thereby enhancing the generalization ability and accuracy of the fault diagnosis model. Finally, through the comparative experiments using the bearing dataset and the rail transit dataset from Case Western Reserve University, the effectiveness of the proposed method was verified.
Keywords
Deep learning,sample imbalance,transfer learning,domain adaptation
Speaker
Jiaxun Du
Mr. Beijing University of Chemical Technology

Submission Author
Jiaxun Du Beijing University of Chemical Technology
Kai Chen Chongqing Rail Transit Operation Co., Ltd.
Liuyang Song Beijing University of Chemical Technology
Xingchi Lu Beijing University of Chemical Technology
Huaqing Wang Beijing University of Chemical Technology
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Important Date
  • Conference Date

    Nov 21

    2025

    to

    Nov 23

    2025

  • Oct 20 2025

    Draft paper submission deadline

  • Dec 08 2025

    Registration deadline

Sponsored By
IEEE Instrumentation and Measurement Society
South China University of Technology
Organized By
South China University of Technology