Research on Anomaly Data Preprocessing Technology for Deep Learning Soft Sensor Models Facing Missing Data and Fault Data
ID:139 View Protection:ATTENDEE Updated Time:2025-11-10 16:00:52 Hits:167 Poster Presentation

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Abstract
Deep learning-based soft sensor technology plays an important role in industrial process monitoring, yet anomalous data such as sensor faults and missing values can severely compromise the predictive performance and reliability of the models. Most existing approaches address only a single type of anomaly, making it difficult to cope with the complex scenarios of multiple coexisting anomalies in real industrial environments. To overcome this limitation, this paper proposes a unified two-stage data preprocessing strategy that integrates anomaly detection and isolation with data reconstruction. In the first stage, a parallel Long Short-Term Memory (LSTM)–Residual Network (ResNet) architecture is employed for fault detection and isolation to identify and separate abnormal data. In the second stage, an improved masked autoencoder model is applied to reconstruct the data at the detected anomaly positions, thereby leveraging the complementary strengths of fault detection and data reconstruction across different anomaly magnitudes. Experimental results on the Tennessee Eastman Process dataset demonstrate that the proposed method achieves an R² of 0.9761, a MAPE of 0.0636%, and an RMSE of 3.6915 in reconstructing anomalous data caused by both sensor faults and missing values.
Keywords
Soft sensor,Fault detection,Data reconstruction,Masked autoencoder
Speaker
Wenbin Zheng
ieee member Harbin Institute of Technology;School of Electronics and Information Engineering; Harbin 150080; P.R. China

Submission Author
Jian Xue Harbin Institute of Technology
Lei Feng Department of Measurement and Control Engineering at the School of Electronics and Information Engineering
Wenlong Hu Harbin Institute of Technology
Yuanzi Li Harbin Institute of Technology
Wenbin Zheng Harbin Institute of Technology;School of Electronics and Information Engineering; Harbin 150080; P.R. China
Bing Liu Harbin Institute of Technology;School of Electronics and Information Engineering
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Important Date
  • Conference Date

    Nov 21

    2025

    to

    Nov 23

    2025

  • Oct 20 2025

    Draft paper submission deadline

  • Dec 08 2025

    Registration deadline

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IEEE Instrumentation and Measurement Society
South China University of Technology
Organized By
South China University of Technology