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Theoretical Calculation and Spectroscopic Characterization of the Electronic Band Structure of High-k Gate Dielectric Hafnium Oxide
ID：175 View Protection：ATTENDEE Updated Time：2025-11-21 00:50:15 Hits：249 Oral Presentation

Start Time：2025-11-22 16:30（Asia/Shanghai）

Duration：10min

Session：S3 Parallel Session 3 » S3-1Parallel Session 3-22 PM

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Abstract
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Keywords
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Speaker
Zhenxuan Li
Xi'an Jiaotong University

Submission Author
Zhenxuan Li Xi'an Jiaotong University
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Important Date

  • Conference Date

    Nov 21

    2025

    to

    Nov 23

    2025

  • Oct 20 2025

    Draft paper submission deadline

  • Dec 08 2025

    Registration deadline

Sponsored By
IEEE Instrumentation and Measurement Society
South China University of Technology
Organized By
South China University of Technology
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