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Investigation of Initial Electronic Structure of Materials Based on Ultraviolet Photoelectron Yield Spectroscopy
ID：24 View Protection：ATTENDEE Updated Time：2025-11-10 10:56:29 Hits：189 Oral Presentation

Start Time：2025-11-22 14:20（Asia/Shanghai）

Duration：10min

Session：S3 Parallel Session 3 » S3-1Parallel Session 3-22 PM

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Abstract
Ultraviolet photoelectron yield spectroscopy (PYS) serves as a powerful surface-sensitive technique for functional material design, device performance optimization, and failure mechanism analysis. By providing indirect access to the initial-state electronic density of states (DOS), PYS enables the detection of weak energy levels within discontinuous valence bands and gap states. Based on Spicer’s three-step photoemission model, a quantitative relationship has been established between the derivative of the photoelectron yield spectrum and the initial state DOS. The PYS measurement was conducted on a high-purity (≥99.99%) clean gold standard sample, and the initial-state DOS was calculated from the yield spectrum. The valence band structure of Au in its initial state was successfully characterized with a width of 3.6 eV. This work demonstrates the feasibility of using PYS as a quantitative tool for probing the intrinsic electronic structure of materials, which contributes a lot to the exploration of future semiconductor material charge carrier transport mechanisms and the optimization of device performance hold significant importance.
Keywords
Initial Electronic Structure ,,Ultraviolet Photoelectron Yield Spectroscopy,density of states
Speaker
Xiaohan Hou
None Xi'an Jiaotong University

Submission Author
Xiaohan Hou Xi'an Jiaotong University
Yu Chen Xi'an Jiaotong University
Yali Guo Xi’an Jiaotong University
Bohao Tong Xi’an Jiaotong University
Linhuan Wei Xi'an Jiaotong University
Shuang Wang Xi'an Jiaotong University
Min Zhang Northwest University； China
Xin Liu Xi’an Jiaotong University
Ishii Hisao Chiba University
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Important Date

  • Conference Date

    Nov 21

    2025

    to

    Nov 23

    2025

  • Oct 20 2025

    Draft paper submission deadline

  • Dec 08 2025

    Registration deadline

Sponsored By
IEEE Instrumentation and Measurement Society
South China University of Technology
Organized By
South China University of Technology
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