Presentation Details
  1. Home
  2. Presentation List
  3. Presentation Details
Research progress of high resolution electron energy loss spectroscopy
ID：30 View Protection：ATTENDEE Updated Time：2025-11-10 11:01:30 Hits：152 Oral Presentation

Start Time：2025-11-22 15:20（Asia/Shanghai）

Duration：10min

Session：S3 Parallel Session 3 » S3-1Parallel Session 3-22 PM

No files

Abstract
As a highly sensitive electronic structure analysis technology, electron energy loss spectroscopy (EELS) has become an important characterization method in materials science and condensed matter physics. By analyzing the energy loss caused by the inelastic scattering of electrons in the process of interaction with matter, this technology can obtain multi-level information on the composition of material elements, chemical bonding state, valence state distribution and local surface plasmon excitation. In recent years, with the rapid development of microscopic imaging resolution, spectral energy resolution and spectral analysis algorithms, EELS instruments and detection methods have made significant progress. EELS technology is mainly divided into two types : projection (TEELS) and reflection (REELS). Based on the brief introduction of the basic principle of high-resolution EELS, this paper systematically reviews the research and development progress of typical instruments in recent years, including the application of high-stability monochromators, the optimization design of high-resolution detectors, and the construction and application of time-resolved and momentum-resolved EELS experimental platforms. Finally, some representative research results are explained and analyzed to provide a systematic reference for relevant researchers, and the development trend and application prospect of EELS in future materials and surface science research are prospected.
Keywords
electron energy loss spectroscopy,energy resolution,monochromator,high-resolution imaging
Speaker
Linhuan Wei
student Xi'an Jiaotong University

Submission Author
Linhuan Wei Xi'an Jiaotong University
Yu Chen Xi'an Jiaotong University
Bohao Tong Xi’an Jiaotong University
Yali Guo Xi’an Jiaotong University
Sichao Zhang Xi’an Jiaotong University
Xiaohan Hou Xi'an Jiaotong University
Xin Liu Xi’an Jiaotong University
Min Zhang Northwest University； China
Shuang Wang Xi‘an Jiaotong University
Submit Comment
Verify Code Change Another
All Comments
Important Date

  • Conference Date

    Nov 21

    2025

    to

    Nov 23

    2025

  • Oct 20 2025

    Draft paper submission deadline

  • Dec 08 2025

    Registration deadline

Sponsored By
IEEE Instrumentation and Measurement Society
South China University of Technology
Organized By
South China University of Technology
Contact Information
Login to view full contact details
Previous Conferences