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Photoelectron Pulse Counting System for Ultraviolet Photoelectron Spectroscopy Instrument
ID：41 View Protection：ATTENDEE Updated Time：2025-11-10 11:16:33 Hits：79 Oral Presentation

Start Time：Pending（Asia/Shanghai）

Duration：Pending

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Abstract
Ultraviolet photoelectron spectroscopy analyzers are used to analyze the binding energy of valence electrons on material surfaces, thereby investigating their electronic structures. To meet the demand for high-precision detection of photoelectron signals on material surfaces, this study independently designed a high-performance pulsed counting electronics system. The system adopts a channel electron multiplier as the core detector, constructs a counting module with FPGA as the core, achieves a high-speed processing capability of 200 MHz through phase-locked loop frequency multiplication, and realizes accurate measurement with a dynamic range of 8 orders of magnitude by means of gating timing and dual-channel differential counting. An FPGA control program based on Verilog HDL was developed, covering pulse counting, UART communication, and I²C threshold adjustment functions, and upper computer software was designed based on the .NET framework. Experimental verification shows that the system counting error is less than 0.0006%, providing key technical support for the study of electronic states on material surfaces.
 
Keywords
Ultraviolet Photoelectron Detector; Single-Photon Counting; FPGA; Dual-Threshold Discrimination
Speaker
Yining Wang
student Xi'an Jiaotong University

Submission Author
Yining Wang Xi'an Jiaotong University
Yu Chen Xi'an Jiaotong University
Linhuan Wei Xi'an Jiaotong University
Long Chen Xi'an Jiao Tong University
Shuang Wang Xi'an Jiaotong University
Xin Liu Xi’an Jiaotong University
Jie Bai Xi'an Jiaotong University
Ishii Hisao Chiba University
Min Zhang Northwest University； China
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Important Date

  • Conference Date

    Nov 21

    2025

    to

    Nov 23

    2025

  • Oct 20 2025

    Draft paper submission deadline

  • Dec 08 2025

    Registration deadline

Sponsored By
IEEE Instrumentation and Measurement Society
South China University of Technology
Organized By
South China University of Technology
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