An Transformer-LSTM Network for Composite Performance Degradation Prediction
ID:46 View Protection:ATTENDEE Updated Time:2025-11-10 11:23:12 Hits:157 Oral Presentation

Start Time:2025-11-22 16:00(Asia/Shanghai)

Duration:20min

Session:S4 Parallel Session 4 » S4-1Parallel Session 4-22 PM

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Abstract
Accurately predicting the performance degradation of composite laminates remains a considerable challenge, primarily due to the multi-physics coupled phenomena, intricate damage evolution, and the inherent limitations of conventional mathematical formulations. Deep learning, with its outstanding capacity for pattern recognition and complex mapping, offers a robust solution to circumvent the limitation of physics priors. In this work, a novel Transformer-LSTM network is presented specifically for the prediction of the performance degradation of composite laminates. During this process, the Transformer-LSTM network is systematically constructed to optimize its performance for the unique features of composite performance degradation. A series of experiments are implemented to verify the effectiveness of the model on several high-dimensional and nonlinear composite degradation dataset. This work emphasizes the potential of advanced adhibition of deep learning to predict the performance degradation of composite laminates with self-data, which provides a novel insight for the accurate prediction of nonlinear and high-dimensional degradation data in actual applications.
Keywords
Composite, performance degradation prediction, data-driven, Transformer-LSTM network
Speaker
Xin He
Master Harbin Institute of Technology

Submission Author
Yafei Xu Harbin Institute of Technology
Xin He Harbin Institute of Technology
Hua Zhang Harbin Institute of Technology
Xiyuan Peng Harbin Institute of Technology
Datong Liu Harbin Institute of Technology
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Important Date
  • Conference Date

    Nov 21

    2025

    to

    Nov 23

    2025

  • Oct 20 2025

    Draft paper submission deadline

  • Dec 08 2025

    Registration deadline

Sponsored By
IEEE Instrumentation and Measurement Society
South China University of Technology
Organized By
South China University of Technology