LTQU-Net: Learnable TQWT-Enhanced Unrolling Net for Interpretable Cross-Domain Fault Diagnosis
ID:62 View Protection:ATTENDEE Updated Time:2025-11-10 11:32:07 Hits:169 Oral Presentation

Start Time:2025-11-23 09:30(Asia/Shanghai)

Duration:20min

Session:S2 Parallel Session 2 » S2-2Parallel Session 2-23 AM

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Abstract
In real-world industrial environments, achieving interpretability in cross-domain fault diagnosis is essential for ensuring transparency in the decision-making process. Traditional deep learning-based approaches, however, lack sufficient exploration of interpretable invariant feature learning for cross-domain fault diagnosis. To address this gap, we propose a novel method, Learnable TQWT-Enhanced Unrolling Net (LTQU-Net). Specifically, the network first employs a Learnable TQWT Subband Alignment and Fusion module to extract physically meaningful time–frequency features, enabling the sparse representations obtained by TQWT to be trainable in an end-to-end manner. Furthermore, by adopting algorithm unrolling, the sparse coding process is unfolded into a deep network, where the inherent interpretability of iterative algorithms is transferred to the dictionary learning process. In addition, we design a set of task-specific loss functions to further enhance the performance of cross-domain fault diagnosis. Experimental results on publicly available datasets demonstrate that LTQU-Net achieves significantly higher accuracy than existing methods while ensuring interpretability. This work provides a transparent and effective solution for intelligent fault diagnosis under cross-domain conditions.
Keywords
algorithm unrolling,TQWT,interpretable,cross-domain fault diagnosis
Speaker
Yiyue Zhang
Student South China University of Technology

Submission Author
Yiyue Zhang South China University of Technology
Gang Chen South China University of Technology
Zhenpeng Lao South China University of Technology
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Important Date
  • Conference Date

    Nov 21

    2025

    to

    Nov 23

    2025

  • Oct 20 2025

    Draft paper submission deadline

  • Dec 08 2025

    Registration deadline

Sponsored By
IEEE Instrumentation and Measurement Society
South China University of Technology
Organized By
South China University of Technology