Design and CST Simulation of a Low-Energy Monochromated Electron Gun
ID:147 View Protection:ATTENDEE Updated Time:2026-10-15 09:35:22 Hits:1 Oral Presentation

Start Time:Pending(Asia/Shanghai)

Duration:Pending

Session:No Session »

No files

Abstract
A low-energy monochromated electron gun for inverse photoemission spectroscopy is designed and investigated using CST particle tracking. The system combines a prescribed electron-emission boundary, two reversed electrostatic sector monochromators, and a five-stage transfer lens. Separately optimized 127°, 144°, and 162° sectors are compared, and the 144° configuration is selected for its reported 1.361 meV energy width and complete transmission in the single-stage calculation. With two 144° sectors, the reported output widths are 4.383, 11.491, and 10.990 meV for zero, 6%, and 12% initial energy-spread settings, respectively. Under the same lens-input conditions, the five-stage lens reduces the beam extent at a plane 20 mm downstream from 4.5 mm × 4.5 mm to 1.6 mm × 1.6 mm relative to the three-stage lens, while maintaining approximately 5 eV mean output energy. The integrated model gives an approximately 0.35 mm × 0.16 mm footprint. Its energy-distribution fit is centered at 5.036 eV with a full width at half maximum of 12.3 meV. These results support the proposed combination of low-energy selection and downstream beam delivery.
Keywords
low-energy electron gun, electrostatic sector monochromator, electron-optical simulation, transfer lens, inverse photoemission spectroscopy
Speaker
Jiajie Zhou
Student Xi'an Jiaotong University

Submission Author
Jiajie Zhou Xi'an Jiaotong University
Sichao Zhang Xi’an Jiaotong University
Linhuan Wei Xi'an Jiaotong University
Jingyi Liu Xi'an Jiaotong University
Xiaohan Hou Xi'an Jiaotong University
双 王 西安交通大学
Xin Liu Xi’an Jiaotong University
佳乐 毛 西安交通大学
Yu Chen Xi'an Jiaotong University
Submit Comment
Verify Code Change Another
All Comments
Important Date
  • Conference Date

    Nov 06

    2026

    to

    Nov 08

    2026

  • Oct 15 2026

    Draft paper submission deadline

Sponsored By
IEEE Instrumentation and Measurement Society
Organized By
Sichuan University