A Method for Measuring the Valence Band Maximum from UPS Based on Adaptive Wavelet Denoising and Genetic Algorithm
ID:148 View Protection:ATTENDEE Updated Time:2026-10-15 09:35:54 Hits:2 Oral Presentation

Start Time:Pending(Asia/Shanghai)

Duration:Pending

Session:No Session »

No files

Abstract
An automated method for extracting characteristic valence-band spectral edges from ultraviolet photoelectron spectroscopy (UPS) is proposed by combining adaptive wavelet denoising with genetic-algorithm-based two-segment linear fitting. After gold-reference energy calibration and baseline correction, a Daubechies 8 wavelet is used to suppress high-frequency noise while preserving local spectral-slope changes. A characteristic edge interval is then automatically selected, and a continuous two-segment model is optimized using a genetic algorithm with the Huber loss function. Highly oriented pyrolytic graphite  is employed as a proof-of-concept sample because its high conductivity minimizes charging effects and its pronounced π-derived valence-band feature provides a distinct spectral edge. The proposed procedure yields an extrapolated characteristic edge energy of 1.895 eV relative to the Fermi level. This value is interpreted as a π-derived spectral-edge energy rather than a conventional semiconductor VBM. The method reduces dependence on manual fitting-region selection and enables automated UPS spectral-edge analysis.
Keywords
Ultraviolet Photoelectron Spectroscopy,Valence Band Maximum,Wavelet Denoising,Genetic Algorithm,Data Fitting
Speaker
ZhenXuan Li
student Xi’an Jiaotong University

Submission Author
ZhenXuan Li Xi’an Jiaotong University
Xiaohan Hou Xi'an Jiaotong University
Tan Ao Xi an Jiaotong University
Bohao Tong Xi'an Jiaotong University
Yali Guo Xi’an Jiaotong University
Xin Liu Xi’an Jiaotong University
双 王 西安交通大学
Ishii Hisao Chiba University
Yu Chen Xi'an Jiaotong University
Submit Comment
Verify Code Change Another
All Comments
Important Date
  • Conference Date

    Nov 06

    2026

    to

    Nov 08

    2026

  • Oct 15 2026

    Draft paper submission deadline

Sponsored By
IEEE Instrumentation and Measurement Society
Organized By
Sichuan University