Laplace-Guided Dual-Branch Flow Matching for Data Augmentation in Few-Shot Fault Diagnosis
ID:30 View Protection:ATTENDEE Updated Time:2026-09-14 13:24:48 Hits:1 Poster Presentation

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Abstract
Data scarcity remains a major obstacle to reliable fault diagnosis in industrial applications, where vibration signals are often affected by background noise. Although generative data augmentation provides a practical approach to addressing the scarcity of fault samples, existing methods still exhibit notable limitations. Adversarial models often suffer from unstable training and mode collapse, while diffusion-based approaches typically rely on costly iterative sampling. The performance of existing generative methods may further deteriorate in the presence of industrial noise. To overcome these limitations, a Laplace-Guided Dual-Branch Flow Matching framework (Laplace-FM) is proposed for few-shot fault data generation. The framework employs conditional Flow Matching to learn a continuous transport process from Gaussian noise to the real fault data distribution, thereby providing stable training and efficient sample generation. To improve feature extraction from industrial vibration signals, a dual-branch structure is incorporated into a one-dimensional U-Net. One branch directly processes the raw signal to retain complete waveform information, while the other applies a learnable Laplace kernel with damped-oscillatory characteristics to emphasize fault-related impulsive and resonant responses while reducing the influence of unstructured noise components. Experiments conducted on real-world industrial data demonstrate that Laplace-FM can generate realistic fault samples and provide effective data augmentation for downstream diagnosis. The results further show that the proposed framework achieves favorable performance in both generation efficiency and fault information preservation.
Keywords
Flow Matching,Limited data,Data generation,GAN,DDPM,Fault diagnosis
Speaker
Menghua Wei
Master's student South China University of Technology

Submission Author
Weihua Li South China University of Technology
Menghua Wei South China University of Technology
Jiaxian Chen South China University of Technology
Hao Lan South China University of Technology
Xu Tan South China University of Technology
Aoyu Zhao South China University of Technology
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Important Date
  • Conference Date

    Nov 06

    2026

    to

    Nov 08

    2026

  • Oct 15 2026

    Draft paper submission deadline

Sponsored By
IEEE Instrumentation and Measurement Society
Organized By
Sichuan University