Research of Magnetic Field-Enhanced Capacitively Coupled Plasma Etching Process
ID:35 View Protection:ATTENDEE Updated Time:2026-10-06 17:31:31 Hits:27 Poster Presentation

Start Time:2026-10-10 16:36(Asia/Shanghai)

Duration:1min

Session:PS Poster Session » PS-1Poster Session

No files

Abstract
Capacitive coupled plasma is widely used in semiconductor etching, but traditional structures have disadvantages such as low internal density and uneven distribution of plasma, as well as low processing efficiency and long processing cycles. In order to improve industrial manufacturing efficiency, this paper designs a magnetic field enhanced capacitive coupled plasma etching system. Based on the principle of magnetron sputtering, a rectangular magnet is coupled at the bottom of the lower plate, and the plasma is constrained by the magnetic field. The etching experiment was conducted using the system under different process parameters, and the experimental results showed that there was a certain combination of process parameters that significantly improved the etching efficiency. This verified that the etching system can effectively increase the plasma density inside the reaction chamber, further improving the production efficiency of semiconductor.
Keywords
Capacitively Coupled Plasma; Magnetic Confinement; Etching Process; Semiconductor Devices
Speaker
JU Shaojia
student xi'an technological university

Submission Author
JU Shaojia xi'an technological university
Submit Comment
Verify Code Change Another
All Comments
Important Date
  • Conference Date

    Oct 09

    2026

    to

    Oct 11

    2026

  • Sep 23 2026

    Draft paper submission deadline

  • Oct 15 2026

    Registration deadline

Sponsored By
Beijing Institute of Technology
Organized By
Beijing Institute of Technology