Introduction

As it happens with design automation, Analog and Mixed-Signal test solutions are much less generic than their siblings from the digital world. In spite of the high costs associated to specification-based test, the industry seemed reluctant to invest in alternatives. Why would we change something that worked? But with the rise of safety-critical applications, reliability requirements are increasing and quality is nowadays a strong asset in competitive markets. Specification-based test cannot be considered perfect any longer. The golden reference is shattered and this is an opportunity for the Analog and Mixed-Signal test community.

Call for paper

Important date

2017-04-28
Draft paper submission deadline
2017-05-15
Draft paper acceptance notification
2017-06-02
Final paper submission deadline

Submission Topics

The International Mixed-Signals Testing Workshop is a forum that brings together this community to discuss ideas and views on the following topics, among others:

  • Test generation

  • Fault modeling and simulation

  • Test metrics estimation

  • Self-healing and self-adaptation

  • Built-in self-test

  • Design-for-test

  • Fault diagnosis

  • Failure analysis

  • Defect characterization

  • ATE technology

  • Economics of test and yield optimization

  • On-line test

  • Fault tolerance

  • Reliability and design-for-reliability

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Important Date
  • Conference Date

    Jul 03

    2017

    to

    Jul 05

    2017

  • Apr 28 2017

    Draft paper submission deadline

  • May 15 2017

    Draft Paper Acceptance Notification

  • Jun 02 2017

    Final Paper Deadline

  • Jul 05 2017

    Registration deadline

Sponsored By
IEEE Council on Electronic Design Automation