Introduction

The 11th international conference on measurement science, technologies and devices will be held from 29 to 31 May, 2017 in the Smolenice castle situated in Low Carpathian mountains near Bratislava, Slovakia. The main topics of the conference will cover three areas: theoretical problems of measurement, measurement of physical quantities and measurement in biology and medicine. Conference proceedings will be available at the time of the conference. The proceedings will be submitted to IEEE Explore. Authors of selected papers will be invited for publication of the topic in extended form in the impacted on-line journal Measurement Science Review published by de Gruyter and indexed in Web of Science, Thomson Scientific SSCI, Scopus, EBSCO and several other databases.

Call for paper

Important date

2017-04-07
Draft paper submission deadline

Submission Topics

Theoretical Problems of Measurement

  • theory of measurement

  • mathematical processing of measured data 

  • measurement uncertainty minimization

  • statistical methods in data evaluation and modeling

  • measurement as an interdisciplinary activity

  • measurement science in education

Measurement of Physical Quantities

  • measurement of basic physical quantities

  • magnetic and electric fields measurements

  • measurement in material science

  • measurement of geometrical and mechanical quantities

  • measurement in electromagnetic compatibility

  • measurement in semiconductors R&D

  • measurement in nanotechnology

Measurement in Biomedicine

  • biosensors

  • bioelectric and biomagnetic fields measurement

  • biosignal measurement, processing and analysis

  • medical imaging, image processing and technologies

  • model based biomeasurements

  • neural networks in biomeasurement

  • telemeasurement in biomedicine

  • nanomeasurement in medicine

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Important Date
  • Conference Date

    May 29

    2017

    to

    May 31

    2017

  • Apr 07 2017

    Draft paper submission deadline

  • May 31 2017

    Registration deadline

Sponsored By
IEEE