2017 IEEE East-West Design & Test Symposium (EWDTS)

EWDTS-2017 topics:

• Analog, Mixed-Signal and RF Test

• ATPG and High-Level TPG

• Automotive Reliability & Test

• Built-In Self Test

• Debug and Diagnosis

• Defect/Fault Tolerance and Reliability

• Design Verification and Validation

• EDA Tools for Design and Test

• Embedded Software

• Failure Analysis & Fault Modeling

• Functional Safely

• High-level Synthesis

• High-Performance Networks and Systems on a Chip

• Internet of Things Design & Test

• Low-power Design

• Memory and Processor Test

• Modeling & Fault Simulation

• Network-on-Chip Design & Test

• Flexible and Printed Electronics

• Applied Electronics – Automotive/Mechatronics

• Algorithms

• Object-Oriented System Specification and Design

• On-Line Testing

• Power Issues in Design & Test

• Real Time Embedded Systems

• Reliability of Digital Systems

• Scan-Based Techniques

• Self-Repair and Reconfigurable Architectures

• Signal and Information Processing in Radio and Communication Engineering

• Neural  networks in nonlinear signal, video and audio processing and technical optimization tasks

• System Level Modeling, Simulation & Test Generation

• System-in-Package and 3D Design & Test

• Using UML for Embedded System Specification

• Optical signals in communication and Information Processing

• CAD and EDA Tools, Methods and Algorithms

• Hardware Security and Design for Security

• Logic, Schematic and System Synthesis

• Place and Route

• Thermal and Electrostatic Analysis of SoCs

• Wireless and RFID Systems Synthesis

• Sensors and Transducers

• Medical Electronics

• Design of Integrated Passive Components