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236 / 2017-11-22 11:49:28
Study on interfacial properties of SiC MOS with Barium
SiC,MOS,SiC/SiO2 interface
Plenary track > Gate dielectrics and surface passivation
Final Paper
Jia-Min Jie / Xidian University
Xiao-Yan Tang / Xidian University
Yu-Ming Zhang / Xidian University
Yi-Fan Jia / Xidian University
Important Date

  • Conference Date

    May 17

    2018

    to

    May 19

    2018

  • Dec 08 2017

    Abstract Submission Deadline

  • Jan 30 2018

    Abstract Notification of Acceptance

  • Feb 10 2018

    Draft paper submission deadline

  • Feb 10 2018

    Final Paper Deadline

  • May 19 2018

    Registration deadline

Sponsored By
IEEE
Organized By
Xi'an Jiaotong University
Xidian University
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