Abstract List
My Submissions
354
A new termination structure with FLR and trench for 3.3kV SiC PiN diodeFinal Paper

Wang cailin*

Plenary Track > Device structures and fabrication techniques

309
High-Voltage 4H-SiC GTO Thyristor with Multiple Floating Zone Junction Termination ExtensionFinal Paper

Xingliang Xu*, Kun Zhou, Lin Zhang, Zhiqiang Li, Chengquan Xiao, Lianghui Li, Juntao Li, Gang Dai

Plenary Track > Device structures and fabrication techniques

304
A 10kV 4H-SiC PiN Diode with Gradual Doping Buffer Layers and p+ Adjusting Regions at CathodeFinal Paper

Wang cailin*

Plenary Track > Device structures and fabrication techniques

278
High Breakdown Field AlGaN/GaN HEMT with AlN Super Back BarrierFinal Paper

Yanmin Guo, Yulong Fang*, Jiayun Yin, Bo Wang, Zhirong Zhang, Jia Li, Weili Lu, Nan Gao, Zhihong Feng

Plenary Track > Device structures and fabrication techniques

273
SiC Trench IGBT with a UV-Shaped GateFinal Paper

Zhengxin Wen, Feng Zhang*, Zhanwei Shen, Guoguo Yan, Xingfang Liu, Guosheng Sun, Yiping Zeng

Plenary Track > Device structures and fabrication techniques

271
Demonstration of GaN pn junction by implanting fluorine ions into free-standing bulk substrate n-GaNFinal Paper

Plenary Track > Device structures and fabrication techniques

269
Study on the New Structure of SiGe HBT with Field PlateFinal Paper

Plenary Track > Device structures and fabrication techniques

259
A Near Ideal Edge Termination Technique for Ultrahigh-Voltage 4H-SiC Devices with Multi-Zone Gradient Field Limiting RingFinal Paper

Xiaochuan Deng*

Plenary Track > Device structures and fabrication techniques

257
Comparison of CF4 plasma versus Cl2 plasma dry etching for gate-recessed Normally-off GaN-based MISHEMTFinal Paper

Bin Hou*

Plenary Track > Device structures and fabrication techniques

245
Simulation Study Of An Injection Enhanced SiC IGBTFinal Paper

Shan Jiang, Xiao-Yan Tang*, Qingwen Song, Yuming ZHANG

Plenary Track > Device structures and fabrication techniques

234
Improved fmax and breakdown voltage in AlGaN/GaN HEMT with plasma treatmentFinal Paper

MINHAN MI*

Plenary Track > Device structures and fabrication techniques

227
Low temperature epitaxial deposition of GaN layers on sitall ceramic substratesFinal Paper

Dimiter Alexandrov et. all.*

Plenary Track > Device structures and fabrication techniques

214
Fully recessed-gate normally-off AlGaN/GaN high electron mobility transistors with high breakdown electric fieldFinal Paper

Yun-Long He*

Plenary Track > Device structures and fabrication techniques

203
Enhanced DC and RF Characteristics in E∕D-mode AlGaN∕GaN HEMTs by TiN-based source contact technologyFinal Paper

Ling Yang*

Plenary Track > Device structures and fabrication techniques

195
Vertical GaN MOSFETs with Over 1.6 kV breakdown voltage :A theoretical studyingFinal Paper

yanni Zhang, zhiyu Lin*, dai Yang*, jincheng Zhang

Plenary Track > Device structures and fabrication techniques

    15 Records 1/1
Important Date
  • Conference Date

    May 17

    2018

    to

    May 19

    2018

  • Dec 08 2017

    Abstract Submission Deadline

  • Jan 30 2018

    Abstract Notification of Acceptance

  • Feb 10 2018

    Draft paper submission deadline

  • Feb 10 2018

    Final Paper Deadline

  • May 19 2018

    Registration deadline

Sponsored By
IEEE
Organized By
Xi'an Jiaotong University
Xidian University
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