Introduction

The ART workshop focuses exclusively on test and reliability of automotive and mission-critical electronics, including design, manufacturing, burn-in, system-level integration and in-field test, diagnosis and repair solutions, as well as architectures and methods for reliable and safe operations under different environmental conditions. With increasing system complexity, security, stringent runtime requirements for functional safety and cost constraints of a mass market the reliable operation of electronics in safety-critical domains is still a major challenge. The ART Workshop offers a forum to present and discuss these challenges and emerging solutions among researchers and practitioners alike. ART will take place in conjunction with the IEEE International Test Conference (ITC) and is sponsored by the Test Technology Technical Council (TTTC) of IEEE Computer Society.

Call for paper

Submission Topics

You are invited to participate and submit your contributions to the ART Workshop. The workshop's areas of interest include (but are not limited to) the following topics:

  • Functional safety

  • Robustness and security in automotive

  • Multi-layer dependability evaluation

  • Verification and validation of automotive systems

  • Automotive standards and certification - ISO 26262

  • Fault tolerance and self-checking circuits

  • Dependability challenges of autonomous driving and e-mobility

  • Transient events- effects and mitigation

  • Aging effects on automotive electronics

  • Power-up, power-down and periodic test

  • System level test

  • Built-In Self-Test (BIST and SBST) in automotive systems

  • Functional and structural test generation

  • High quality volume test- minimizing DPPM

  • Life cycle test cost minimization

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Important Date
  • Conference Date

    Nov 02

    2017

    to

    Nov 03

    2017

  • Nov 03 2017

    Registration deadline