The 15th IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC)

610 / 2019-03-15 22:26:17

An SET Generation Circuit with Tunable Pulse Width

SET, pulse generation circuit, SOI

Plenary track > Device and Circuit Reliability

Digital ICs are more and more susceptible to the single-event transient (SET) due to the shrinkage of the process node. An SET generation circuit with tunable pulse width is proposed in this paper, which can offer 32 different pulse width to provide more convenient and adjustable input signals dedicated for SET pulse measurement circuits or SET hardened circuits. A time accuracy of pico-second order of magnitude and the output range less than 3 nanoseconds can be obtained through CMOS 0.18 μm SOI process by simulation.