2019 IEEE 22nd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)

DDECS’19 covers the areas of design and testing of electronic components, both digital and analog. The topics include the following but are not limited to:
SoC and NoC Design and Test
ASIC/FPGA Design
Built-in Self-Test and Self-Repair
Bio-Inspired Hardware
Design Verification/Validation
Formal Methods in System Design
Hardware/Software Co-Design
IP-based Design
Logic Synthesis
Modeling, circuit design and test for emerging technologies-based data storage/memory
Modeling, circuit design and test for emerging technologies-based computation structures
Defect/Fault Tolerance and Reliability
Design and Test in Nano-Technologies
Analog, Mixed-Signal, RF Design and Test
ATE Hardware and Software
Design for Testability and Diagnosis
Embedded Systems
Dependable HW / SW Systems
On-line Testing
Memory, Processor Testing
MEMS Testing
Physical Design
Cyber Physical Systems
Industry 4.0
Embedded Machine Learning
Self-Aware Systems Design and Test
Unconventional Computing Paradigms
Emerging technologies-based logic design, test and reliability
Internet-of-Things Design and Test
Case Studies and Applications
Functional Safety
Reliability testing
Hardware Security and Trust
Security Primitives
Hardware Trojans
Fault and Side-Channel Attacks and Countermeasures
Hardware Security and Emerging Technologies