Influence of CucorAl wire bonding on reliability of SiC devices
ID:39 View Protection:PUBLIC Updated Time:2021-07-21 20:02:14 Hits:1424 Poster Presentation

Start Time:2021-08-27 12:29(Asia/Shanghai)

Duration:1min

Session:P Poster » P1Poster 1

Abstract
With the continuous development of power electronics technology, the performance requirements for high-power semiconductor devices are also increasing, such as improving device rated power, reducing device volume, increasing power density and increasing working temperature. In this paper, the effects of Al bonding wire and CucorAl bonding wire on the power cycling capability of SiC devices are studied by experiment and numerical simulation. The power cycling fatigue life of different bonding wires was obtained through the power cycling test of SiC substrate bonded by Al wires and CucorAl wires. The experimental result shows that the power cycling ability of CucorAl wires is higher than that of Al wires.
Keywords
Wire Bond,SiC,power cycling
Speaker
Fang Chao
Zhuzhou CRRC Times Semiconductor Co., Ltd.

Submission Author
Fang Chao Zhuzhou CRRC Times Semiconductor Co., Ltd.
Xiang Tang Zhuzhou CRRC Times Semiconductor Co., Ltd.
Guangyuan Qin Zhuzhou CRRC Times Semiconductor Co., Ltd.
Haotao Ke Zhuzhou CRRC Times Semiconductor Co., Ltd.
Yibo Wu Zhuzhou CRRC Times Semiconductor Co., Ltd.
Jing Zhang Heraeus Materials Technology Shanghai Ltd.
Guiqin Chang Zhuzhou CRRC Times Semiconductor Co., Ltd.
Haihui Luo Zhuzhou CRRC Times Semiconductor Co., Ltd.
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Important Date
  • Conference Date

    Aug 25

    2021

    to

    Aug 27

    2021

  • Apr 21 2021

    Abstract Submission Deadline

  • May 15 2021

    Abstract Notification of Acceptance

  • Jun 25 2021

    Final Paper Deadline

  • Aug 24 2021

    Contribution Submission Deadline

  • Aug 27 2021

    Registration deadline

Sponsored By
IEEE
IEEE ELECTRONIC DEVICE SOCIETY
Organized By
Huazhong University of Science and Technology