Dr. Adit Singh is Godbold Endowed Chair Professor of Electrical and Computer Engineering at Auburn University, where he has served on the faculty since 1991. Earlier he has held faculty positions at the University of Massachusetts in Amherst, and Virginia Tech, in Blacksburg. He has also held visiting professorships at the University of Freiburg, Germany, and the University of Tokyo, Japan, and a Fulbright at the University Polytechnic of Catalonia in Barcelona, Spain. His research interests span all aspects of VLSI technology, with an emphasis on IC test and reliability; he has published widely in these areas. Professor Singh has held leadership roles as General Chair/Co-Chair/Program Chair for dozens of VLSI design and test conferences, and regularly serves on the Steering and Program Committees of many major international conferences in test and design automation. For two terms (2007-11), he was elected Chair of the IEEE Test Technology Technical Council (TTTC), and also served (2011-2015) on the Board of Governors of the IEEE Council on Design Automation (CEDA). He holds a B.Tech in Electrical Engineering from IIT Kanpur, and the M.S. and Ph.D. from Virginia Tech. He was elected Fellow of IEEE in 2002.
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2021
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2021
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2022-08-24 Taiwan, China Taipei
2022 IEEE International Test Conference in Asia2019-09-03 Japan Tokyo
2019 IEEE International Test Conference in Asia2018-08-15 China
2018 IEEE International Test Conference in Asia2017-09-13 Taiwan, China Taipei
2017 IEEE International Test Conference in Asia2014-11-10 China 杭州市
IEEE International Test Conference in Asia
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