Presentation Details
Rigorous Test Flow for PLL to Identify Weak Devices
Start Time：2021-08-20 21:45（Asia/Shanghai）
Duration：20min
Session：SS Special Session »
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Abstract
Education:
BS, EE Dept., National Taiwan University, 1988
MS, EE Dept., National Taiwan University, 1992
Ph.D., ECE Dept., Univ. of Santa Barbara, 1997
Experience:
Joined National Tsing Hua University since 1999
Current Research Interests:
Cell-based Timing Circuit Design and Compiler,
and their applications for VLSI Testing and Online Monitoring.
Keywords
Speaker
Shi-Yu Huang
National Tsing Hua UniversityPresenter: Prof. Shi-Yu Huang, National Tsing Hua University, Taiwan
Education:
BS, EE Dept., National Taiwan University, 1988
MS, EE Dept., National Taiwan University, 1992
Ph.D., ECE Dept., Univ. of Santa Barbara, 1997
Experience:
Joined National Tsing Hua University since 1999
Current Research Interests:
Cell-based Timing Circuit Design and Compiler,
and their applications for VLSI Testing and Online Monitoring.
All Comments
Important Date
-
Conference Date
Aug 18
2021
toAug 20
2021
-
May 10 2021
Draft paper submission deadline
-
Aug 16 2021
Early Bird Registration
-
Aug 19 2021
Contribution Submission Deadline
-
Aug 20 2021
Registration deadline
Sponsored By
Tongji University
Chinese Computer Federation
Organized By
Contact Information
- Prof. Zhang Ying
- yi******@tongji.edu.cn
Previous Conferences
-
2022-08-24 Taiwan, China Taipei
2022 IEEE International Test Conference in Asia -
2019-09-03 Japan Tokyo
2019 IEEE International Test Conference in Asia -
2018-08-15 China
2018 IEEE International Test Conference in Asia -
2017-09-13 Taiwan, China Taipei
2017 IEEE International Test Conference in Asia -
2014-11-10 China 杭州市
IEEE International Test Conference in Asia
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