2021 IEEE International Test Conference in Asia (ITC-Asia 2021)

Katherine Shu-Min Li

Katherine Shu-Min Li (S’04, M’06, S. M' 13-now) received the B.S. degree from Rutgers University, New Brunswick, NJ, and the M.S. and Ph.D. degrees from National Chiao  Tung University,  Hsinchu,  Taiwan, in 2001 and 2006, respectively. She is currently a Full Professor with the Department of Computer Science and Engineering, National Sun Yat-Sen University, Kaohsiung, Taiwan.
Her current  research  interests  include  Interposer Test, 2.5D/3D/SiP IC Test, Microfluidic Chip Synthesis & Test, Hardware Security & Trojan, Side Channel Effect, Design for Security (DfS), Machine Learning, Big Data, Crosstalk  Effects,  Signal & Power Integrity, SOC testing, Floorplanning and Routing for Testability and Yield Enhancement, Design for Yield (DfX), Scan  Reordering, Scan  Routing,  Low-Power  Scan  Techniques, particularly on Oscillation Ring Test Schemes, and Interconnect Optimization. Her recent researches involve also in cross-field exploration in research field of IC Design & Test (D&T), Electronics Design Automation & Test (EDA&T), Computer Integrated Manufacturing (CIM), Computer Aided Design (CAD) and Computer Aided Engineering (CAE) in Factory Automation (Industry 4.0), especially High Frequency Trading (HFT) in FinTech.
Dr.  Li  is  a  member  of  IEEE Education and IEEE  Circuits   and  Systems Society, Association for Computing Machinery (ACM), and ACM Special Interest Group on Design Automation, IEEE Women in Engineering (WIE) (Oct. 13-now).