2021 IEEE International Test Conference in Asia (ITC-Asia 2021)

Compared chip scale increasing exponentially with Moore’s law, Scan IO bandwidth keeps stable. Using a serial high-speed interface to load-unload Scan data is a very effective solution to replace the traditional one which would make higher scan test parallelism, more reasonable Channel Compression and reduced Test System complexly.
From a semiconductor company, the presentation would introduce some industrial implementation trends or requirement to HSPHY design, Physical design, SCAN Compression and vector convert.   
The Standard’s application would be begin with Scan Data throughput to end with Test Data throughput containing Scan data, JTAG data or other data. In the end of the presentation, there is some prospective to the future of High-speed Scan technology.

High Speed SCAN;;Scan distrubution system;PCS;PHY