2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)

AboutComponents, Circuits, Devices and Systems
Keywords:Embedded Systems,design automation,Circuit testing,System Testing,Integrated Circuit Reliability,Hardware Software Co-design,Approximate Computing,emerging technologies,dependable systems,embedded AIML,Application-specific Integrated Circuit (asic),System on Chip,Field Programmable Gate Array (FPGA).
Scope:The main focus of this conference is on EDA methods for design, test, and diagnosis of microelectronic digital, analog, and mixed-signal circuits and systems, and is therefore perfectly aligns with the CEDA and EDA community. Topics of interest listed in CFP cover design automation and testing for emerging technologies, embedded systems, dependable systems, embedded AI/ML, approximate computing, hardware-software codesign, ASICs/SoC/FPGA/Memory systems, etc. See details at https://ddecs2023.taltech.ee/DDECS2023-Preliminary-CFP.pdf
Sponsor Type:1; 9